Study of magnetic spacing sensitivity due to gram load, PSA and dynamic flying height using dynamic electrical test based on wallace spacing technique | |
| Author | Kitti Tangtrakoon |
| Call Number | AIT Thesis no.ISE-09-27 |
| Subject(s) | Magnetism Data tapes |
| Note | A thesis submitted in partial fulfillment of the requirements for the degree of Master of Engineering in Mechatronics, School of Engineering and Technology |
| Publisher | Asian Institute of Technology |
| Series Statement | Thesis ; no. ISE-09-27 |
| Abstract | Nowadays, the requirement of the huge data storage, hard disk is one of the most important components within the PC. It has been improved rapidly in every respect such as capacity, speed, and power usage by over the last few decades. Mention on the capacity or areal density improvement, there are many components that influence to outcome of it. Head media spacing, one of the most sensitive parameter to bit error rate performance is needed to be studied. However, with the limitation of current equipments those are insufficient to support. Thus, to determine head media spacing using dynamic electrical test is necessary due to the sufficiency of accuracy and lower cost. To satisfy the study of head media spacing, test algorithm based on Wallace spacing technique has been created using WDK Script software version Microsoft Excel-Visual Basic Base for WITE32 and execute on Guzik, dynamic electronic tester. Gauge repeatability and reproducibility of HMS test is acceptable with 5.47% of contribution. Using this created test script to study sensitivity of gram load, pitch static altitude and dynamic flying height that effect to head media spacing, find that gram load sensitivity is around -3.84 nm per gram, pitch static altitude sensitivity is around -0.70 nm per degree and dynamic flying height sensitivity is around -2.93 nm per volt. In additional to sensitivity estimation, zero flying height is detected in experiment of dynamic flying height sensitivity. It is around 8.5. Thus the estimate model for HMS in this study is HMS GL Δ−Δ−= PSA − 93.270.084.35.8 Δ + sfDFHV )( , where is function of test operation condition. |
| Year | 2009 |
| Corresponding Series Added Entry | Asian Institute of Technology. Thesis ; no. ISE-09-27 |
| Type | Thesis |
| School | School of Engineering and Technology (SET) |
| Department | Department of Industrial Systems Engineering (DISE) |
| Academic Program/FoS | Industrial Systems Engineering (ISE) |
| Chairperson(s) | Bargmann, Brent |
| Examination Committee(s) | Afzulpurkar, Nitin V.;Lertsak Lekawat;Srimes Rattanachai |
| Scholarship Donor(s) | Western Digital;NECTEC;Asian Institute of Technology Fellowship |
| Degree | Thesis (M.Eng.) - Asian Institute of Technology, 2009 |