Study of low MRR failure due to ESD and scratch damaged by using QST parameter | |
| Author | Sinchai Cheryklin |
| Call Number | AIT Thesis no.ISE-09-37 |
| Subject(s) | Scratch (Electronic resource) Hard disks (Computer science) Electrostatics Magnetic recorders and recording heads |
| Note | A thesis submitted in partial fulfillment of the requirements for the degree of Master of engineering, School of Engineering and Technology |
| Publisher | Asian Institute of Technology |
| Series Statement | Thesis ; no. ISE-09-37 |
| Abstract | The goal of this thesis is to find how to identify the degradation of the read-write head due to Electrostatic Discharge (ESD) and scratch by using Quasi Static Test (QST). The degradation of read-write head due to both ESD and scratch causes QST to show low magnetoresistive resistance (MRR). Since the structure of the read-write head which is Tunneling Magnetoresistive (TuMR) head composes of very thin layers of thin film structure, consequently, the TuMR heads become more sensitive to mechanical, voltage and current variations. Typically, ESD and scratch are the most majority defects causing resistance decreasing and amplitude degradation. Unfortunately, the existing parameters of QST cannot identify the failures of the read-write heads damaged either by ESD or scratch. However, there are some information indirectly from QST to be analyzed to identify the defects caused by ESD and scratch. Therefore, the analytical methods are studied by varying bias voltage and external fields applied to the read-write heads during measurements with QST. The results are compared and analyzed by using fitting curves. Finally, the process to identify the defects of the read-write head due to ESD and scratch is obtained. |
| Year | 2009 |
| Corresponding Series Added Entry | Asian Institute of Technology. Thesis ; no. ISE-09-37 |
| Type | Thesis |
| School | School of Engineering and Technology (SET) |
| Department | Department of Industrial Systems Engineering (DISE) |
| Academic Program/FoS | Industrial Systems Engineering (ISE) |
| Chairperson(s) | Lertsak Lekawat |
| Examination Committee(s) | Wanchai Pijitrojana;Bargmann, Brent |
| Scholarship Donor(s) | Western Digital;NECTEC;Asian Institute of Technology Fellowship |
| Degree | Thesis (M.Eng.) - Asian Institute of Technology, 2009 |