1 AIT Asian Institute of Technology

Control chart for chip attach process at intel assembly and test factory in Vietnam

AuthorNguyen Tuan Nga
Call NumberAIT Thesis no.ISE-13-17
Subject(s)Assembly-line methods-Vietnam
Process control--Vietnam

NoteA project submitted in partial fulfillment of the requirement s for the degree of Master of Engineering (Professional) in Industrial and Manufa cturing Engineering with Area of Specialization in Industrial Engineering and Management, School of Engineering and Technology
PublisherAsian Institute of Technology
Series StatementThesis ; no. ISE-13-17
AbstractIn an economic development environment today , quality plays a very decisive role to the existence and development of every business , e spec ially in semiconductors field where the customers always put very high expectation for quality of all devices. But, there is a question about how to sa ti s fy the customer requirement for product quality . Along with the development of statistical science an d technological support, one of the excellence approach es to overcome the challenge of quality control is to use statistical process c ontrol (SPC) . We can understand that SPC is a statistical tool that uses to monitor and control process in order to reduce its variability. By using SPC we expect that the process operates predictably to produce as much good products as possible. When the quantity of defective s will be r educed, the product cost is going to be less and the business is profitable. Control char t is the most important tool among major tools of SPC. It is used for differentiating between common cause s and special cause s . Nowadays control charts are essential tools for every stage of the process or equipment evaluation, characterization and improve ment. A control chart typical ly has center line which is the average process performance and its control limits ( upper control limit, lower control limit ) which are used to determine whether or not the process still in control or stable. There are two type s of control chart depending on data characteristic including Variables C ontrol Chart and A ttribute s control c hart. The variable s control c hart s are applied for the data that following a continuous distribution while the attribute s control c harts are commo nly established for the data following a discrete distribution to determine a product as a conforming or nonconforming. This project will go deeply in to the fundamental theory and method s of constructing and using control chart in order to monitor and ide ntify the process shift . Therefore, corrective action may be taken before the product is manufactured.
Year2013
Corresponding Series Added EntryAsian Institute of Technology. Thesis ; no. ISE-13-17
TypeThesis
SchoolSchool of Engineering and Technology (SET)
DepartmentDepartment of Industrial Systems Engineering (DISE)
Academic Program/FoSIndustrial Systems Engineering (ISE)
Chairperson(s)Voratas Kachitvichyanukul
Examination Committee(s)Huynh Trung Luong
Scholarship Donor(s)Intel Products Vietnam Company Limited
DegreeThesis (M.Eng.)-Asian Institute of Technology, 2013


Usage Metrics
View Detail0
Read PDF0
Download PDF0