| Author | Karim, Farzia |
| Note | A thesis submitted in partial fulfillment of the requirements for the
degree of Master of Engineering in
Nanotechnology |
| Publisher | Asian Institute of Technology |
| Abstract | This work presents a scheme for in situ monitoring of anodic alumina film growth. A fiber optic sensor based on Fabry Pérot interferometric technique with the combination of DC electrochemical anodization method has been established for the first time to monitor the in
situ growth of anodized aluminum oxide (AAO) film and measure the thickness of AAO. The anodization of aluminum sample was performed in different (2%, 4%, 5%, 6%, 8% and 10%) sulfuric acid (H2SO4) solutions by DC electrochemical methods at room temperature. The estimated thickness in situ was verified by SEM characterization and electrochemistry measurements. This study shows that, the measurement of thickness of anodic alumina film in situ is feasible as it closely matched the thickness determined by scanning electron microscopy and other electrochemistry characterization techniques. |
| Year | 2013 |
| Type | Thesis |
| School | School of Engineering and Technology (SET) |
| Department | Department of Industrial Systems Engineering (DISE) |
| Academic Program/FoS | Nanotechnology |
| Chairperson(s) | Dutta, Joydeep; |
| Examination Committee(s) | Mohammed, Waleed S.;Hornyak, Gabor L.;Habib, Khaled; |
| Scholarship Donor(s) | Ministry of Foreign Affairs;Norway; |