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Real time monitoring system of reliability stress tests for semiconductor | |
Author | Nguyen Huu Hoang |
Call Number | AIT Thesis no.ISE-02-15 |
Subject(s) | Real-time data processing Real-time control Industries--Data processing |
Note | A thesis submitted in partial fulfillment of the requirements for the degree of Master of Engineering, School of Advanced Technologies |
Publisher | Asian Institute of Technology |
Series Statement | Thesis ; no. ISE-02-15 |
Abstract | In manufacturing field, it is necessary to monitor parameters of machines, or a process for productions. The Real-time monitoring system is supported by the computer industry and high technology, gives manufacturers a lot of advantages. Those are labor reduction, improving quality of process, reducing maintenance time, low cost investment, etc ... So this study purposes to present the structure of a Real-time monitoring system. And giving a model is applied for the monitoring system in Rel Lab AMO. The basic structure of a monitoring system consists of measuring instrument, data receiving and processing and generating message announcement and report equipments. The AMD Real-time monitoring system is developed on this basic structure. It consists of three components, are field device, communication and computer. This study presents the AMD Real-time monitoring system development in the applying of B&R 2003 PLC and Siemens Simatic Window control center (WinCC). |
Year | 2002 |
Corresponding Series Added Entry | Asian Institute of Technology. Thesis ; no. ISE-02-15 |
Type | Thesis |
School | School of Advanced Technologies (SAT) |
Department | Department of Industrial Systems Engineering (DISE) |
Academic Program/FoS | Industrial Systems Engineering (ISE) |
Chairperson(s) | Afzulpurkar, Nitin V.; |
Examination Committee(s) | Bohez, Erik L. J.;Huynh Trung Luong;Belforte, Gustavo;Pichit Saengpongpaew; |
Scholarship Donor(s) | Ministry of Education and Training of Vietnam; |
Degree | Thesis (M.Eng.) - Asian Institute of Technology, 2002 |