1 AIT Asian Institute of Technology

Real time monitoring system of reliability stress tests for semiconductor

AuthorNguyen Huu Hoang
Call NumberAIT Thesis no.ISE-02-15
Subject(s)Real-time data processing
Real-time control
Industries--Data processing

NoteA thesis submitted in partial fulfillment of the requirements for the degree of Master of Engineering, School of Advanced Technologies
PublisherAsian Institute of Technology
Series StatementThesis ; no. ISE-02-15
AbstractIn manufacturing field, it is necessary to monitor parameters of machines, or a process for productions. The Real-time monitoring system is supported by the computer industry and high technology, gives manufacturers a lot of advantages. Those are labor reduction, improving quality of process, reducing maintenance time, low cost investment, etc ... So this study purposes to present the structure of a Real-time monitoring system. And giving a model is applied for the monitoring system in Rel Lab AMO. The basic structure of a monitoring system consists of measuring instrument, data receiving and processing and generating message announcement and report equipments. The AMD Real-time monitoring system is developed on this basic structure. It consists of three components, are field device, communication and computer. This study presents the AMD Real-time monitoring system development in the applying of B&R 2003 PLC and Siemens Simatic Window control center (WinCC).
Year2002
Corresponding Series Added EntryAsian Institute of Technology. Thesis ; no. ISE-02-15
TypeThesis
SchoolSchool of Advanced Technologies (SAT)
DepartmentDepartment of Industrial Systems Engineering (DISE)
Academic Program/FoSIndustrial Systems Engineering (ISE)
Chairperson(s)Afzulpurkar, Nitin V.;
Examination Committee(s)Bohez, Erik L. J.;Huynh Trung Luong;Belforte, Gustavo;Pichit Saengpongpaew;
Scholarship Donor(s)Ministry of Education and Training of Vietnam;
DegreeThesis (M.Eng.) - Asian Institute of Technology, 2002


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