1 AIT Asian Institute of Technology

Probability distribution of cropping factors in the RS-SWAP-GA data assimilation technique

AuthorKulkarni, Rushikesh Prakashrao
Call NumberAIT Thesis no.RS-06-5
Subject(s)Crops and soils--Remote sensing
Crops and water--Remote sensing
NoteA thesis submitted in partial fulfillment of the requirements for the degree of Master of Engineering
PublisherAsian Institute of Technology
AbstractAgricultural monitoring is important to predict the crop yield and water requirement. Low resolution remote sensing has been proven its efficiency in monitoring large area at high temporal frequencies. The research is going on to find out the activities which can not be seen directly from remote sensing. Data assimilation technique has been developed which give single sowing date for one pixel. This obtained single sowing date indicate that sowing has been done in one day in one sq.km area which is not possible. This study is an approach to find number of days taken for sowing in one sq.km area. The SWAP model has been provided with multiple sowing dates and average of all obtained LAI has been calculated. This calculated average simulated LAI has been compared with SPOT VI LAI. Result obtained from the assimilation of average simulated LAI and remote sensing LAI gives better fitness than the assimilation of simulated LAI with single sowing date and remote sensing LAI. Harvesting of sugarcane has been observed during the data collection. Emergence date has been derived from harvesting date. The average LAI calculated from multiple LAI obtained by running SWAP with different emergence dates has been compared with SPOT LAI. The fitness obtained by average simulated LAI has been checked changing MND(maximum number of days for sowing) for both crop rice and sugarcane. The fitness increases with increase in MND
Year2006
TypeThesis
SchoolSchool of Engineering and Technology (SET)
DepartmentDepartment of Information and Communications Technologies (DICT)
Academic Program/FoSRemote Sensing (RS)
Chairperson(s)Honda, Kiyoshi
Examination Committee(s)Susaki, Juriichi;Surat Lertlum
Scholarship Donor(s)AIT Fellowship
DegreeThesis (M.Eng.) - Asian Institute of Technology, 2006


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