1 AIT Asian Institute of Technology

A study of ATM cell synchronization in a bursty-error environment

AuthorYu, Nicholas Ronald Llanto
Call NumberAIT RSPR no. TC-94-12
Subject(s)Telecommunication

NoteA research submitted in partial fulfillment of the requirements for the degree of Master of Engineering, School of Advanced Technologies
PublisherAsian Institute of Technology
Series StatementResearch studies project report ; no. TC-94-12
AbstractSynchronization of cells in ATM is unique in the sense that it makes use of the Header Error Control (HEC) as the unique pattern to delineate the boundaries of the cell. The performance of the ATM cell synchronization is still under study in ITU-T. Using the timing param~ters developed by CHOI (1990), this study makes a performance analysis of the cell synchronization algorithm in the presence of bursty errors and takes into consideration the limitation of the CRC in detecting errors. The results of the study show that the limitation of the CRC in detecting errors degrades the performance of the cell synchronization. At bit error rates of 104 or lower, the cell synchronization performance is found to be robust against bit errors and the type of error distribution practically does not even affect the pe1formance. However, as the BER increases to a value higher than 10-2 , the perfmmance of the cell synchronization degrades abruptly and the bursty errors are found to degrade the cell synchronization perfonnance more than the random errors.
Year1994
Corresponding Series Added EntryAsian Institute of Technology. Research studies project report ; no. TC-94-12
TypeResearch Study Project Report (RSPR)
SchoolSchool of Advanced Technologies (SAT)
DepartmentOther Field of Studies (No Department)
Academic Program/FoSTelecommunications (TC)
Chairperson(s)Takahashi, Kenzo;
Examination Committee(s)Erke, Tapio J.;Makelainen, Kimmo;
Scholarship Donor(s)Finnish International Development Agency (FINNIDA);
DegreeResearch Studies Project Report (M.Eng.) - Asian Institute of Technology, 1994


Usage Metrics
View Detail0
Read PDF0
Download PDF0