Cost analysis of attribute single sampling plans with inspection errors | |
| Author | Si Liwo, Yu Hok |
| Call Number | AIT RSPR no. IE-86-15 |
| Subject(s) | Quality control Cost control |
| Note | A research study submitted in partial fulfilment of the requirements for the degree of Master of Engineering, School of Engineering and Technology |
| Publisher | Asian Institute of Technology |
| Abstract | The cost models previously developed on the basis of Bayesian sampling plans require prior knowledge of distribution of t h e received lot quality. This study examines the quality control situations where lots are either accepted or rejected on the basis of a randomly drawn single sample. A general method is also considered for acceptance or rejection decision making on incoming materials. Given the two decision variables , acceptance cost and rejection cost, together with other arbitrary cost parameters' cost functions and prior distribution of incoming materials' quality, the error-prone cost model is formulated so as to examine the effects of inspection errors to the total expected costs of the designed optimal plans where conventionally, an error-free situation has been assumed. The optimality, error-to-cost and arbitrary cost parameters sensitivities, were accomplished by using an Incremental Search Procedure developed and transformed in computer programmes. All the cost evaluations in lieu of the cost models proved to assist the decision maker intuitively observing the errors and selecting the optimal plan that most fit to the described errors environment. |
| Year | 1986 |
| Type | Research Study Project Report (RSPR) |
| School | School of Engineering and Technology (SET) |
| Department | Other Field of Studies (No Department) |
| Academic Program/FoS | Industrial Engineering (IE) |
| Chairperson(s) | Tabucanon, Mario T. |
| Examination Committee(s) | Mohanty, Rajendra P. ;Frausum, Yves G. Van |
| Scholarship Donor(s) | The Government of Australia |
| Degree | Research Studies Project Report (M. Sc.) - Asian Institute of Technology, 1986 |