AI Search
Home
Advanced Search
Browse
by Author
by Title
by Subject
by Year
by Academic Program/FoS
by Callnumber
by Type
Contact Us
Login
Select a search option
Author
Title
Subject
Year
Academic Program/FoS
Callnumber
Chairperson
by Examination Commitee
Scholarship Donor
Search Now
Results For "Intel Corporation--Production" in Subject
1 Results on February 28, 2026
Browse by School
S E R D
S E T
S O M
(S E R D) + (S E T)
(S E R D) + (S O M)
S A T
School of Civil Engineering
Student Research Before 1980
Browse by Type
Capstone Project
Dissertation
Past Examination Papers
Project
Research Report
Research Study Project Report (RSPR)
Special Study Project Report (SSPR)
Thesis
Sort by
Title Ascending
Title Descending
Year Ascending
Year Descending
Modified shewhart attribute control charts to detect defects for final inspection process at intel products Vietnam
by
Ho Ngoc Vy
Callnumber:
AIT Thesis no.ISE-13-18
First
Prev
1
Next
Last